The sensor particularly benefits applications in solar wafer and surface inspection: With its square 1 inch optical format and 2048x2048 pixel resolution the sensor perfectly inspects even larger or round surfaces in full detail. This reduces the number of cameras required and therefore overall costs. A range of further IDS specific special functions plus the sensor’s global shutter ensure detailed, crisp and distortion-free images in all conditions.
Additionally, the UI-3370CP-NIR is a perfect choice for a range of applications in web and high-speed inspection and can easily replace a fully-fledged with the IDS specific triggered line scan mode that allows to capture up to 8000 fps.
Including the new UI-3370CP-NIR camera, there are currently 12 USB 3 uEye CP models available offering a great variety of resolutions from VGA to 5 Megapixel in an extremely compact and lightweight magnesium housing. With a C-mount lens mount, lockable USB 3.0 and Hirose connectors, a serial interface and optically decoupled trigger and flash, the cameras are easily integrated in all applications.