Deembedding test fixtures for high-speed digital applications
Summary
This webinar is intended for engineers who work on digital design and test. Particularly we will be discussing the impact of test fixture deembedding on digital interface testing. After a quick introduction to the principles of test fixture modelling and deembedding we will be starting with a deeper dive into deembedding models and measurements with vector network analyzers according to IEEE370 requirements and recommendations. Once we will have built the deembedding models by reference to USB 3.2 test fixtures we will be switching to the interface testing through oscilloscope measurements. While watching eye pattern and advanced jitter analysis you will be learning how important text fixture deembedding is for accurate digital interface testing.
Speakers:
Martin Stumpf
Market Segment Manager, High-Speed Digital Design Test, Rohde & Schwarz
Dr. Mathias Hellwig
Senior Application Engineer, Rohde & Schwarz
Fabian Altenbrunn
Application Engineer, Wuerth Elektronik
This webinar is intended for engineers who work on digital design and test. Particularly we will be discussing the impact of test fixture deembedding on digital interface testing. After a quick introduction to the principles of test fixture modelling and deembedding we will be starting with a deeper dive into deembedding models and measurements with vector network analyzers according to IEEE370 requirements and recommendations. Once we will have built the deembedding models by reference to USB 3.2 test fixtures we will be switching to the interface testing through oscilloscope measurements. While watching eye pattern and advanced jitter analysis you will be learning how important text fixture deembedding is for accurate digital interface testing.
Speakers:
Martin Stumpf
Market Segment Manager, High-Speed Digital Design Test, Rohde & Schwarz
Dr. Mathias Hellwig
Senior Application Engineer, Rohde & Schwarz
Fabian Altenbrunn
Application Engineer, Wuerth Elektronik